Raman-AFM excites at MRS Fall
Renishaw introduced its new integrated Raman AFM package—developed in collaboration with Bruker Nano—at the Fall MRS meeting in Boston, MA, with acclaim from delegates.
21 December 2011
Renishaw introduced its new integrated Raman AFM package—developed in collaboration with Bruker Nano—at the Fall MRS meeting in Boston, MA, with acclaim from delegates.

Users can easily acquire Raman and AFM images from the same area on the sample thanks to a communication link between the two systems that shares positional information. Each system can also be operated autonomously, if necessary, having its own standard software package and controlling computer.
Renishaw demonstrated a working model at its booth, generating a great deal of interest in the system, with very high booth traffic. A team of Bruker applications scientists were also present to answer technical questions about the AFM system and demonstrate the capabilities of the Innova AFM system itself.
Visitors were very impressed with the small footprint of the system and its flexibility, with tip-enhanced Raman spectroscopy (TERS) being an area of great interest. The simplicity of analysis setup and ease of sample change also surprised visitors.
This unique integrated package transforms Raman-AFM, making it much more efficient and much easier to use. Renishaw's Raman-AFM team looks forward to reading the first exciting research papers from customers with the inVia-Innova combined system.
Further information
For more information and downloads about Renishaw's Raman-AFM products, visit the Raman-AFM section of our website.To see a short video about the Renishaw-Bruker system, recorded at MRS Fall, visit the AZoM website.
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