材料科学関連資料

Product note detailing how you can perform Rayleigh imaging on the inVia confocal Raman microscope.

Product note: Rayleigh imaging using the inVia™ confocal Raman microscope

Product note detailing how you can perform Rayleigh imaging on the inVia confocal Raman microscope.

[1.7MB]

When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

Application note: Photocurrent measurements on the inVia™ confocal Raman microscope

When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

[1.6MB]

An article in Compound Semiconductor magazine, October 2015, describes how Raman spectroscopy allows routine mapping of SiC wafers in little more than an hour.

News release: Identifying imperfections with Raman spectroscopy

An article in Compound Semiconductor magazine, October 2015, describes how Raman spectroscopy allows routine mapping of SiC wafers in little more than an hour.

[2.2MB]

When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

Application note: Photocurrent measurements on the inVia™ confocal Raman microscope

When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties. This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

[1.6MB]

A poster demonstrating the inVia's capabilities at studying the efficiency of solar cells against the quality of their manufacture.

Poster: Simultaneous photocurrent and Raman mapping of single crystalline silicon solar cell modules

A poster demonstrating the inVia's capabilities at studying the efficiency of solar cells against the quality of their manufacture.

[914kB]