複合型/ハイブリッドシステム関連資料

The integration of the inVia confocal Raman microscope with the Dimension series AFMs combines industry leading instruments to provide a solution that gives the best possible performance:

Product note: inVia™ confocal Raman microscope and Dimension AFM integration

The integration of the inVia confocal Raman microscope with the Dimension series AFMs combines industry leading instruments to provide a solution that gives the best possible performance:

[129kB]

Product note - Combined Raman/AFM (atomic force microscope) systems are excellent for characterising the properties of materials at sub-micrometre, and potentially nanometre, scales.Tip-enhanced Raman scattering (TERS) provides chemical imaging at the nanometre scale, enabling you to take your research to a whole new level.

Product note: Renishaw Raman-AFM/TERS solutions

Product note - Combined Raman/AFM (atomic force microscope) systems are excellent for characterising the properties of materials at sub-micrometre, and potentially nanometre, scales.Tip-enhanced Raman scattering (TERS) provides chemical imaging at the nanometre scale, enabling you to take your research to a whole new level.

[411kB]

Renishaw’s structural and chemical analyser unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful new technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.

Product note: SCA - diamond composite analysis

Renishaw’s structural and chemical analyser unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful new technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.

[138kB]

Electron imaging and Raman spectroscopy are established techniques for viewing and analysing carbon nanotubes. Performing these two techniques usually requires the sample being transferred between a scanning electron microscope (SEM) and a Raman spectrometer. This application note illustrates the advantages of Renishaw’s structural and chemical analyser (SCA) for simultaneous secondary electron imaging and Raman spectroscopy of single-wall carbon nanotubes (SWNTs).

Application note: A study of single-wall carbon nanotubes using Renishaw's structural and chemical analyser for scanning electron microscopy

Electron imaging and Raman spectroscopy are established techniques for viewing and analysing carbon nanotubes. Performing these two techniques usually requires the sample being transferred between a scanning electron microscope (SEM) and a Raman spectrometer. This application note illustrates the advantages of Renishaw’s structural and chemical analyser (SCA) for simultaneous secondary electron imaging and Raman spectroscopy of single-wall carbon nanotubes (SWNTs).

[357kB]

SEM-SCA analysis helps in the preservation of a corroding bronze statue of the Roman god Ares from the ancient city of Zeugma in Turkey.

Application note: SCA oxidation application note - cultural heritage

SEM-SCA analysis helps in the preservation of a corroding bronze statue of the Roman god Ares from the ancient city of Zeugma in Turkey.

[354kB]

This note illustrates how the SEM-SCA can be used to study the corrosion of copper wire and nuclear reactor steel (four pages).

Application note: SCA oxidation application note - copper and steel

This note illustrates how the SEM-SCA can be used to study the corrosion of copper wire and nuclear reactor steel (four pages).

[345kB]

An article in the July/August 2016 issue of Microscopy and Analysis presents a new system that physically couples a Raman spectroscopy system with a nanoindenter on a shared stage that uniquely enables combined assessment of materials with submicrometre spatial resolution at single sites or spanning millimetre-sized regions.

News release: Combined Raman spectroscopy and nanoindentation assessment of complex materials

An article in the July/August 2016 issue of Microscopy and Analysis presents a new system that physically couples a Raman spectroscopy system with a nanoindenter on a shared stage that uniquely enables combined assessment of materials with submicrometre spatial resolution at single sites or spanning millimetre-sized regions.

[2.2MB]