 | 物性物理現在、このページはご希望の言語でご利用いただけません。 Google 翻訳を使用すると自動翻訳でページを表示できます。 弊社はこのサービスの提供に責任を持たず、翻訳結果を弊社でチェックすることはありません。 さらにサポートをご希望の場合は、弊社までお問い合わせください。
|

Material science provides a varied and challenging range of samples for spectroscopic analysis which is ideally suited to the versatility offered by Renishaw's inVia Raman microscope. Typical materials include composites, polymers and catalyst reagents. Many of these samples can benefit from a second, complementary analysis technique, such as the pioneering structural and chemical analyser, or SEM-SCA, a combination of scanning electron microscope (SEM) and microRaman capabilities
For example, a recent case study involved the use of Renishaw Raman technology to investigate a crack in a steel component from a nuclear reactor. It was thought, and confirmed by initial microRaman analysis, that the cracking was caused by oxidation induced brittleness. In order to understand more fully the processes involved in this degradation, and hence allow preventative steps to be initiated, a more detailed analysis was required. The large depth of field and chemical analysis on the micron scale afforded by the SEM-SCA successfully facilitated this specific analysis. For more examples of material analysis using SEM-SCA and combined FT-IR Raman systems, please download the relevant document.
Please note that document downloads require registration. |
Selected publications
Advances in the Raman depth profiling of polymer laminates (2003), C Froud et al, Applied Spectroscopy, 57,12,1468-1474
Transmission electron microscope radiation damage of 4H and 6H SiC by photoluminescence spectroscopy (2002), J Steeds et al, Diamond and related materials, 11, 1923-1945 |